Простийпошук |
Розширенийпошук |
Покажчики
|
Професійний пошук |
Рубрикатор НБУВ |
Розподілений пошук |
Бази даних
Наукова періодика України - результати пошуку
Книжкові видання та компакт-дискиЖурнали та продовжувані виданняАвтореферати дисертаційРеферативна база данихНаукова періодика УкраїниТематичний навігаторАвторитетний файл імен осіб
 |
Для швидкої роботи та реалізації всіх функціональних можливостей пошукової системи використовуйте браузер "Mozilla Firefox" |
|
|
Повнотекстовий пошук
| Знайдено в інших БД: | Реферативна база даних (3) |
Список видань за алфавітом назв: Авторський покажчик Покажчик назв публікацій  |
Пошуковий запит: (<.>A=Borcha M$<.>) | |||
|
Загальна кількість знайдених документів : 2 Представлено документи з 1 до 2 |
|||
| 1. | 
Fodchuk I. Determination of structural homogeneity of synthetic diamonds from analysis of Kikuchi lines intensity distribution [Електронний ресурс] / I. Fodchuk, S. Balovsyak, M. Borcha, Ya. Garabazhiv, V. Tkach // Semiconductor physics, quantum electronics & optoelectronics. - 2010. - Vol. 13, № 3. - С. 262-267 . - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2010_13_3_8 It has been suggested the technique based on analysis of geometry and intensity distribution profiles in Kikuchi patterns obtained due to electron backscattering diffraction for defining structural imperfection of diamond crystals. To determine the geometry parameters in Kikuchi patterns with the maximal precision, the special software was developed. It has been shown that application of electron diffraction (Kikuchi method) allows to obtain information about degree of perfection and homogeneity of real structure for diamond crystals synthesized with various methods. | ||
| 2. |
Borcha M. D. Features of structural changes in mosaic Ge:Sb according to X-ray diffractometry and electron backscatter diffraction data [Електронний ресурс] / M. D. Borcha, M. S. Solodkyi, S. V. Balovsyak, V. M. Tkach, I. I. Hutsuliak, A. R. Kuzmin, O. O. Tkach, V. P. Kladko, O. Yo. Gudymenko, O. I. Liubchenko // Semiconductor physics, quantum electronics & optoelectronics. - 2019. - Vol. 22, № 4. - С. 381-386. - Режим доступу: http://nbuv.gov.ua/UJRN/MSMW_2019_22_4_4 The structural homogeneity and degree of perfection inherent to mosaic Ge:Sb samples were investigated. The modified methods for analyzing diffraction images of backscattered electrons (Kikuchi patterns) were used to reduce the influence of instrumental factors. The root-mean-square deformations in the local regions of separate grains and at the boundaries between them were determined using the value of the spatial frequency of the energy spectrum of two-dimensional Fourier transform of Kikuchi patterns. It is shown that the maximum values of deformations (~<$E3,5~cdot~10 sup -3>) are typical for local regions, which are usually located at the boundaries between subgrains. X-ray studies confirm obtained values of root-mean-square deformations.The structural homogeneity and degree of perfection inherent to mosaic Ge:Sb samples were investigated. The modified methods for analyzing diffraction images of backscattered electrons (Kikuchi patterns) were used to reduce the influence of instrumental factors. The root-mean-square deformations in the local regions of separate grains and at the boundaries between them were determined using the value of the spatial frequency of the energy spectrum of two-dimensional Fourier transform of Kikuchi patterns. It is shown that the maximum values of deformations (~<$E3,5~cdot~10 sup -3>) are typical for local regions, which are usually located at the boundaries between subgrains. X-ray studies confirm obtained values of root-mean-square deformations. | ||
Попередній перегляд: 
Реферативна БД
 |
| Відділ наукової організації електронних інформаційних ресурсів |
 Пам`ятка користувача |